Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks

Cryptographic circuits generally are used for applications of wireless sensor networks to ensure security and must be tested in a manufacturing process to guarantee their quality. Therefore, a scan architecture is widely used for testing the circuits in the manufacturing test to improve testability....

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Bibliographic Details
Main Authors: Sangjun Lee, Kyunghwan Cho, Jihye Kim, Jongho Park, Inhwan Lee, Sungho Kang
Format: Article
Language:English
Published: MDPI AG 2021-09-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/21/18/6111