Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks
Cryptographic circuits generally are used for applications of wireless sensor networks to ensure security and must be tested in a manufacturing process to guarantee their quality. Therefore, a scan architecture is widely used for testing the circuits in the manufacturing test to improve testability....
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-09-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/21/18/6111 |
| _version_ | 1797517256314322944 |
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| author | Sangjun Lee Kyunghwan Cho Jihye Kim Jongho Park Inhwan Lee Sungho Kang |
| author_facet | Sangjun Lee Kyunghwan Cho Jihye Kim Jongho Park Inhwan Lee Sungho Kang |
| author_sort | Sangjun Lee |
| collection | DOAJ |
| description | Cryptographic circuits generally are used for applications of wireless sensor networks to ensure security and must be tested in a manufacturing process to guarantee their quality. Therefore, a scan architecture is widely used for testing the circuits in the manufacturing test to improve testability. However, during scan testing, test-power consumption becomes more serious as the number of transistors and the complexity of chips increase. Hence, the scan chain reordering method is widely applied in a low-power architecture because of its ability to achieve high power reduction with a simple architecture. However, achieving a significant power reduction without excessive computational time remains challenging. In this paper, a novel scan correlation-aware scan cluster reordering is proposed to solve this problem. The proposed method uses a new scan correlation-aware clustering in order to place highly correlated scan cells adjacent to each other. The experimental results demonstrate that the proposed method achieves a significant power reduction with a relatively fast computational time compared with previous methods. Therefore, by improving the reliability of cryptography circuits in wireless sensor networks (WSNs) through significant test-power reduction, the proposed method can ensure the security and integrity of information in WSNs. |
| first_indexed | 2024-03-10T07:13:17Z |
| format | Article |
| id | doaj.art-2fd04d4ed1c243cc98b8dfd68a0767c1 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-10T07:13:17Z |
| publishDate | 2021-09-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-2fd04d4ed1c243cc98b8dfd68a0767c12023-11-22T15:11:47ZengMDPI AGSensors1424-82202021-09-012118611110.3390/s21186111Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor NetworksSangjun Lee0Kyunghwan Cho1Jihye Kim2Jongho Park3Inhwan Lee4Sungho Kang5Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, KoreaElectrical and Electronic Engineering Department, Yonsei University, Seoul 03722, KoreaElectrical and Electronic Engineering Department, Yonsei University, Seoul 03722, KoreaElectrical and Electronic Engineering Department, Yonsei University, Seoul 03722, KoreaElectrical and Electronic Engineering Department, Yonsei University, Seoul 03722, KoreaElectrical and Electronic Engineering Department, Yonsei University, Seoul 03722, KoreaCryptographic circuits generally are used for applications of wireless sensor networks to ensure security and must be tested in a manufacturing process to guarantee their quality. Therefore, a scan architecture is widely used for testing the circuits in the manufacturing test to improve testability. However, during scan testing, test-power consumption becomes more serious as the number of transistors and the complexity of chips increase. Hence, the scan chain reordering method is widely applied in a low-power architecture because of its ability to achieve high power reduction with a simple architecture. However, achieving a significant power reduction without excessive computational time remains challenging. In this paper, a novel scan correlation-aware scan cluster reordering is proposed to solve this problem. The proposed method uses a new scan correlation-aware clustering in order to place highly correlated scan cells adjacent to each other. The experimental results demonstrate that the proposed method achieves a significant power reduction with a relatively fast computational time compared with previous methods. Therefore, by improving the reliability of cryptography circuits in wireless sensor networks (WSNs) through significant test-power reduction, the proposed method can ensure the security and integrity of information in WSNs.https://www.mdpi.com/1424-8220/21/18/6111wireless sensor networkscryptographydesign for testability (DFT)low-power testingscan chain reordering |
| spellingShingle | Sangjun Lee Kyunghwan Cho Jihye Kim Jongho Park Inhwan Lee Sungho Kang Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks Sensors wireless sensor networks cryptography design for testability (DFT) low-power testing scan chain reordering |
| title | Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks |
| title_full | Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks |
| title_fullStr | Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks |
| title_full_unstemmed | Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks |
| title_short | Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks |
| title_sort | low power scan correlation aware scan cluster reordering for wireless sensor networks |
| topic | wireless sensor networks cryptography design for testability (DFT) low-power testing scan chain reordering |
| url | https://www.mdpi.com/1424-8220/21/18/6111 |
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