Properties of Inclined Silicon Carbide Thin Films Deposited By Vacuum Thermal Evaporation
In this work, thermal evaporation system was employed to deposit thin films of SiC onglass substrates in order to determine the parameters of them. Measurements includedtransmission, absorption, Seebak effect, resistivity and conductivity, absorption coefficient,type of energy band-gap, extinction c...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Unviversity of Technology- Iraq
2008-08-01
|
| Series: | Engineering and Technology Journal |
| Subjects: | |
| Online Access: | https://etj.uotechnology.edu.iq/article_26691_4b74e50c037d6419d1dc528df206a7c8.pdf |