Electrical Properties and Thermal Annealing Effects of Polycrystalline MoS<sub>2</sub>-MoS<sub>X</sub> Nanowalls Grown by Sputtering Deposition Method

Electrical Properties and Thermal Annealing Effects of Polycrystalline MoS<sub>2</sub>-MoS<sub>X</sub> Nanowalls Grown by Sputtering Deposition Method

Straightforward growth of nanostructured low-bandgap materials is a key issue in mass production for electronic device applications. We report here facile nanowall growth of MoS<sub>2</sub>-MoS<sub>X</sub> using sputter deposition and investigate the electronic properties of...

Full description

Bibliographic Details
Main Authors: Doo-Seung Um, Mi-Jin Jin, Jong-Chang Woo, Dong-Pyo Kim, Jungmin Park, Younghun Jo, Gwan-Ha Kim
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Crystals
Subjects:
MoS<sub>2</sub>
nanowall
crystal growth
sputter deposition
MoS<sub>2</sub> polycrystal characterization
Online Access:https://www.mdpi.com/2073-4352/11/4/351

Internet

https://www.mdpi.com/2073-4352/11/4/351

Similar Items