Optimizing Crop Yield Estimation through Geospatial Technology: A Comparative Analysis of a Semi-Physical Model, Crop Simulation, and Machine Learning Algorithms

Optimizing Crop Yield Estimation through Geospatial Technology: A Comparative Analysis of a Semi-Physical Model, Crop Simulation, and Machine Learning Algorithms

This study underscores the critical importance of accurate crop yield information for national food security and export considerations, with a specific focus on wheat yield estimation at the Gram Panchayat (GP) level in Bareilly district, Uttar Pradesh, using technologies such as machine learning al...

Full description

Bibliographic Details
Main Authors: Murali Krishna Gumma, Ramavenkata Mahesh Nukala, Pranay Panjala, Pavan Kumar Bellam, Snigdha Gajjala, Sunil Kumar Dubey, Vinay Kumar Sehgal, Ismail Mohammed, Kumara Charyulu Deevi
Format: Article
Language:English
Published: MDPI AG 2024-03-01
Series:AgriEngineering
Subjects:
crop yield
DSSAT
ML algorithms
Online Access:https://www.mdpi.com/2624-7402/6/1/45

Internet

https://www.mdpi.com/2624-7402/6/1/45

Similar Items