Stoichiometry loss induced by ionic bombardment of InP surfaces: A challenge for electrochemistry combined with XPS

Stoichiometry loss induced by ionic bombardment of InP surfaces: A challenge for electrochemistry combined with XPS

Indium phosphide (InP) surfaces are greatly affected by ionic bombardment. We investigate the resulting surface perturbation through the use of the complementary analytical techniques of electrochemistry and X-ray photoelectron spectroscopy (XPS). Following bombardment, modifications to the surface...

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Bibliographic Details
Main Authors: S. Béchu, D. Aureau, J. Vigneron, A-M. Gonçalves, M. Frégnaux, M. Bouttemy, A. Etcheberry
Format: Article
Language:English
Published: Elsevier 2020-08-01
Series:Electrochemistry Communications
Subjects:
Indium phosphide
XPS
Electrochemistry
Argon bombardment
Online Access:http://www.sciencedirect.com/science/article/pii/S138824812030117X

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http://www.sciencedirect.com/science/article/pii/S138824812030117X

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