A non–destructive compositional analysis of thin surface films formed on W–xTa alloys by angle resolved X–ray photoelectron spectroscopy
Synergistic effect of the simultaneous additions of tungsten and tantalum in the extremely high corrosion resistance properties of the spontaneously passivated sputter–deposited W–xTa alloys was investigated using a non-destructive angle resolved X-ray photoelectron spectroscopy (angle resolved XPS...
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| Format: | Article |
| Language: | English |
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Department of Physics, Mahendra Morang Adarsh Multiple Campus, Tribhuvan University
2012-01-01
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| Series: | Bibechana |
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| Online Access: | https://www.nepjol.info/index.php/BIBECHANA/article/view/4784 |