Simulation study and parameter optimization of laser TSV using artificial neural networks

Through-Silicon Vias (TSV) play an important role in the field of semiconductor 3D packaging by providing interconnections during layer-by-layer stacking. Laser machining of TSVs is advantageous over expensive photolithography steps in the DRIE process. It is environmentally friendly, reduces produc...

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Bibliographic Details
Main Authors: Dileep Karnam, Yu-Lung Lo, Chia-Hua Yang
Format: Article
Language:English
Published: Elsevier 2023-07-01
Series:Journal of Materials Research and Technology
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785423014473