Microwave Frequency Offset Induced by Subsurface Damage in Abrasive-Machined Semiconductor Ceramic Waveguide

Microwave Frequency Offset Induced by Subsurface Damage in Abrasive-Machined Semiconductor Ceramic Waveguide

Ceramic waveguide components play a critical role in modern microwave semiconductor systems. For the first time, this work reports experimental results obtained when dielectric ceramics are abrasive-machined into waveguide components. This process will cause subsurface damage (SSD), resulting in a d...

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Bibliographic Details
Main Authors: Haoji Wang, Jinhua Wei, Bin Lin, Xiaoqi Cui, Hetian Hou, Zhiyuan Fu, Jianchun Ding, Tianyi Sui
Format: Article
Language:English
Published: MDPI AG 2023-11-01
Series:Machines
Subjects:
ceramic metallization
ceramic waveguide filter
frequency control
microwave dielectric ceramic
mm wave resonator
resonant frequency
Online Access:https://www.mdpi.com/2075-1702/11/12/1057

Internet

https://www.mdpi.com/2075-1702/11/12/1057

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