A New Model of Trapped Charge Sources in Switching Transient Studies in the Presence of Shunt Reactors
Insulation coordination studies are of great importance in power grid reliability. In this paper, a new method is proposed for modeling trapped charge sources (TCS) in switching transient studies. The TCS is used to take into account the voltage stored in line capacitors during reclosing operation a...
প্রধান লেখক: | , , , , |
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বিন্যাস: | প্রবন্ধ |
ভাষা: | English |
প্রকাশিত: |
IEEE
2025-01-01
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মালা: | IEEE Access |
বিষয়গুলি: | |
অনলাইন ব্যবহার করুন: | https://ieeexplore.ieee.org/document/10896640/ |