A numerical study of multi filament formation in metal-ion based CBRAM
This study investigates the underlying mechanisms of multiple conductive filaments (CF) creation in metal-ion based conductive bridge RRAM (CBRAM) by using the Metropolis Monte Carlo algorithm and suggests a possible explanation for this phenomenon. The simulation method is demonstrated over a Cu/Hf...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2016-02-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4942209 |