In-Situ Measurement of Power Loss for Crystalline Silicon Modules Undergoing Thermal Cycling and Mechanical Loading Stress Testing

In-Situ Measurement of Power Loss for Crystalline Silicon Modules Undergoing Thermal Cycling and Mechanical Loading Stress Testing

An in-situ method is proposed for monitoring and estimating the power degradation of mc-Si photovoltaic (PV) modules undergoing thermo-mechanical degradation tests that primarily manifest through cell cracking, such as mechanical load tests, thermal cycling and humidity freeze tests. The method is b...

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Bibliographic Details
Main Authors: Sergiu Spataru, Peter Hacke, Dezso Sera
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Energies
Subjects:
photovoltaic modules
accelerated stress testing
in-situ monitoring
dark I-V curves
thermal cycling
mechanical loading
Online Access:https://www.mdpi.com/1996-1073/14/1/72

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https://www.mdpi.com/1996-1073/14/1/72

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