Modeling of screening effect to number of thermal cycles by investigation of space hardware thermal vacuum test
Thermal vacuum and thermal cycle testing are widely complemented in space flight hardware and components as an effective way to screen out potential defects in manufacture and integration. The number of cycles is a test condition which affects the screening effect. The more cycles makes higher scree...
| Main Authors: | , |
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| Format: | Article |
| Language: | Japanese |
| Published: |
The Japan Society of Mechanical Engineers
2016-02-01
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| Series: | Nihon Kikai Gakkai ronbunshu |
| Subjects: | |
| Online Access: | https://www.jstage.jst.go.jp/article/transjsme/82/835/82_15-00619/_pdf/-char/en |