DSCU-Net: MEMS Defect Detection Using Dense Skip-Connection U-Net
With the rapid development of intelligent manufacturing and electronic information technology, integrated circuits play a vital role in high-end chips. The semiconductor chip manufacturing process requires precise operation and strict control to ensure chip quality. The traditional manual visual ins...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-03-01
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| Series: | Symmetry |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-8994/16/3/300 |