Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell

Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell

Aerospace equipages encounter potential radiation footprints through which soft errors occur in the memories onboard. Hence, robustness against radiation with reliability in memory cells is a crucial factor in aerospace electronic systems. This work proposes a novel Carbon nanotube field-effect tran...

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Bibliographic Details
Main Authors: Bharathi Raj Muthu, Ewins Pon Pushpa, Vaithiyanathan Dhandapani, Kamala Jayaraman, Hemalatha Vasanthakumar, Won-Chun Oh, Suresh Sagadevan
Format: Article
Language:English
Published: MDPI AG 2021-12-01
Series:Sensors
Subjects:
soft errors
CNTFET
linear energy transfer
static noise margin
Online Access:https://www.mdpi.com/1424-8220/22/1/33

Internet

https://www.mdpi.com/1424-8220/22/1/33

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