Intelligent Sensors for dc Fault Location Scheme Based on Optimized Intelligent Architecture for HVdc Systems

Intelligent Sensors for dc Fault Location Scheme Based on Optimized Intelligent Architecture for HVdc Systems

We develop a probabilistic model for determining the location of dc-link faults in MT-HVdc networks using discrete wavelet transforms (DWTs), Bayesian optimization, and multilayer artificial neural networks (ANNs) based on local information. Likewise, feedforward neural networks (FFNNs) are trained...

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Bibliographic Details
Main Authors: Muhammad Zain Yousaf, Muhammad Faizan Tahir, Ali Raza, Muhammad Ahmad Khan, Fazal Badshah
Format: Article
Language:English
Published: MDPI AG 2022-12-01
Series:Sensors
Subjects:
Levenberg–Marquardt backpropagation
protection sensor
Bayesian optimization
modular multilevel converter
Online Access:https://www.mdpi.com/1424-8220/22/24/9936

Internet

https://www.mdpi.com/1424-8220/22/24/9936

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