Single Event Transients in CMOS Ring Oscillators

In this paper, a time-variant analysis is made on Single-Event Transients (SETs) in integrated CMOS ring oscillators. The Impulse Sensitive Function (ISF) of the oscillator is used to analyze the impact of the relative moment when a particle hits the circuit. The analysis is based on simulations and...

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Bibliographic Details
Main Authors: Jeffrey Prinzie, Valentijn De Smedt
Format: Article
Language:English
Published: MDPI AG 2019-06-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/8/6/618