An Effective Charge Neutralization Enabled by Graphene Overlayer in Ambient Pressure XPS Measurements of Insulators

Abstract Ambient pressure XPS is a powerful technique capable of performing measurements with samples kept at mbar pressure. The filled gas, also X‐ray ionized, provides electrons to neutralize positive charges built up on insulating samples. However, this convenient neutralization scheme does not s...

Full description

Bibliographic Details
Main Authors: Chueh‐Cheng Yang, Meng‐Hsuan Tsai, Zong‐Ren Yang, Yaw‐Wen Yang, Yuan‐Chieh Tseng, Chia‐Hsin Wang
Format: Article
Language:English
Published: Wiley-VCH 2023-02-01
Series:Advanced Materials Interfaces
Subjects:
Online Access:https://doi.org/10.1002/admi.202201926