Combining Wave and Particle Effects in the Simulation of X-ray Phase Contrast—A Review
X-ray phase-contrast imaging (XPCI) is a family of imaging techniques that makes contrast visible due to phase shifts in the sample. Phase-sensitive techniques can potentially be several orders of magnitude more sensitive than attenuation-based techniques, finding applications in a wide range of fie...
| Những tác giả chính: | , , , , |
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| Định dạng: | Bài viết |
| Ngôn ngữ: | English |
| Được phát hành: |
MDPI AG
2024-02-01
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| Loạt: | Instruments |
| Những chủ đề: | |
| Truy cập trực tuyến: | https://www.mdpi.com/2410-390X/8/1/8 |