Few-Shot Remote Sensing Image Scene Classification Based on Metric Learning and Local Descriptors

Scene classification is a critical technology to solve the challenges of image search and image recognition. It has become an indispensable and challenging research topic in the field of remote sensing. At present, most scene classifications are solved by deep neural networks. However, existing meth...

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Bibliographic Details
Main Authors: Zhengwu Yuan, Chan Tang, Aixia Yang, Wendong Huang, Wang Chen
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Remote Sensing
Subjects:
Online Access:https://www.mdpi.com/2072-4292/15/3/831