Optical properties study of a perovskite solar cell film stack by spectroscopic ellipsometry and spectrophotometry
Spectroscopic ellipsometry is a reproducible and non-invasive characterization technique that allows the evaluation of multilayered structures. However, it is an indirect technique and requires the use of well-calibrated models to correctly analyze the materials. In this work, we report a multilayer...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2024-05-01
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Series: | Results in Optics |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2666950124000373 |