Optical properties study of a perovskite solar cell film stack by spectroscopic ellipsometry and spectrophotometry

Optical properties study of a perovskite solar cell film stack by spectroscopic ellipsometry and spectrophotometry

Spectroscopic ellipsometry is a reproducible and non-invasive characterization technique that allows the evaluation of multilayered structures. However, it is an indirect technique and requires the use of well-calibrated models to correctly analyze the materials. In this work, we report a multilayer...

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Dettagli Bibliografici
Autori principali:	Maria Fernanda Villa-Bracamonte, Jose Raul Montes-Bojorquez, Arturo A. Ayon
Natura:	Articolo
Lingua:	English
Pubblicazione:	Elsevier 2024-05-01
Serie:	Results in Optics
Soggetti:	Perovskite Spectroscopic ellipsometry Optical properties Refractive index Dielectric function MAPbI3
Accesso online:	http://www.sciencedirect.com/science/article/pii/S2666950124000373

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