Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
Three means are investigated for further increasing the accuracy of the characterization of a thin film on a substrate, from the transmittance spectrum <i>T</i>(<i>λ</i>) of the specimen, based on the envelope method. Firstly, it is demonstrated that the accuracy of character...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-08-01
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| Series: | Materials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1944/14/16/4681 |