Data Augmentation of Backscatter X-ray Images for Deep Learning-Based Automatic Cargo Inspection
Custom inspection using X-ray imaging is a very promising application of modern pattern recognition technology. However, the lack of data or renewal of tariff items makes the application of such technology difficult. In this paper, we present a data augmentation technique based on a new image-to-ima...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-11-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/21/21/7294 |