THz-TDS Techniques of Thickness Measurements in Thin Shim Stock Films and Composite Materials

THz-TDS Techniques of Thickness Measurements in Thin Shim Stock Films and Composite Materials

Terahertz wave (T-ray) scanning applications are one of the most promising tools for nondestructive evaluation. T-ray scanning applications use a T-ray technique to measure the thickness of both thin Shim stock films and GFRP (glass fiber-reinforced plastics) composites, of which the samples were se...

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Bibliographic Details
Main Authors: Kwang-Hee Im, Sun-Kyu Kim, Young-Tae Cho, Yong-Deuck Woo, Chien-Ping Chiou
Format: Article
Language:English
Published: MDPI AG 2021-09-01
Series:Applied Sciences
Subjects:
terahertz waves
refractive index
thickness measurement
Shim stock films
composite materials
reflection mode
Online Access:https://www.mdpi.com/2076-3417/11/19/8889

Internet

https://www.mdpi.com/2076-3417/11/19/8889

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