Performance Degradations of MISFET-Based Hydrogen Sensors with a Pd-Ta<sub>2</sub>O<sub>5</sub>-SiO<sub>2</sub>-Si Structure During Long-Term Operation
We present the generalized experimental results of performance degradation of hydrogen sensors based on metal-insulator-semiconductor field effect transistor (MISFET)with the structure Pd-Ta<sub>2</sub>O<sub>5</sub>-SiO<sub>2</sub>-Si. The <i>n</i>-cha...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2019-04-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/19/8/1855 |