Improving the reliability of Schottky diodes under the influence of electrostatic discharges

Experimental studies of Schottky diodes with molybdenum barrier structure showed that resistance of the structures to electrostatic discharge depends on the design parameters, as well as on guard ring diffusion depth. It has been proven that to improve the reliability of Schottky diodes one should u...

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Bibliographic Details
Main Authors: Sоlоdukha V. A., Turtsevich A. S., Solov’yov J. A., Rubtsevich I. I., Kerentsev A. F.
Format: Article
Language:English
Published: Politehperiodika 2012-10-01
Series:Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Subjects:
Online Access:http://www.tkea.com.ua/tkea/2012/5_2012/pdf/05.zip