Gear involute artifacts with sub-micron profile form deviations: manufacture and new design
Gear involute artifact (GIA) is a kind of calibration standard used for traceability of involute metrology. To machine GIAs with sub-micron profile form deviations, the effect on the involute profile deviations caused by the geometric deviations and 6-DoF errors of the machining tool based on the do...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Polish Academy of Sciences
2023-11-01
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| Series: | Metrology and Measurement Systems |
| Subjects: | |
| Online Access: | https://journals.pan.pl/Content/130306/art04_int_corr.pdf |