Convolutional neural network analysis of x-ray diffraction data: strain profile retrieval in ion beam modified materials

Convolutional neural network analysis of x-ray diffraction data: strain profile retrieval in ion beam modified materials

This work describes a proof of concept demonstrating that convolutional neural networks (CNNs) can be used to invert x-ray diffraction (XRD) data, so as to, for instance, retrieve depth-resolved strain profiles. The determination of strain distributions in disordered materials is critical in several...

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Bibliographic Details
Main Authors: A Boulle, A Debelle
Format: Article
Language:English
Published: IOP Publishing 2023-01-01
Series:Machine Learning: Science and Technology
Subjects:
x-ray diffraction
strain
convolutional neural networks
machine learning
ion irradiation
ion implantation
Online Access:https://doi.org/10.1088/2632-2153/acab4c

Internet

https://doi.org/10.1088/2632-2153/acab4c

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