Accelerated Reliability Growth Test for Magnetic Resonance Imaging System Using Time-of-Flight Three-Dimensional Pulse Sequence

A magnetic resonance imaging (MRI) system is a complex, high cost, and long-life product. It is a widely known fact that performing a system reliability test of a MRI system during the development phase is a challenging task. The major challenges include sample size, high test cost, and long test du...

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Bibliographic Details
Main Authors: Pradeep Kumar Anand, Dong Ryeol Shin, Navrati Saxena, Mudasar Latif Memon
Format: Article
Language:English
Published: MDPI AG 2019-10-01
Series:Diagnostics
Subjects:
Online Access:https://www.mdpi.com/2075-4418/9/4/164