Thermal Drift Correction for Laboratory Nano Computed Tomography via Outlier Elimination and Feature Point Adjustment

Thermal Drift Correction for Laboratory Nano Computed Tomography via Outlier Elimination and Feature Point Adjustment

Thermal drift of nano-computed tomography (CT) adversely affects the accurate reconstruction of objects. However, feature-based reference scan correction methods are sometimes unstable for images with similar texture and low contrast. In this study, based on the geometric position of features and th...

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Bibliographic Details
Main Authors: Mengnan Liu, Yu Han, Xiaoqi Xi, Siyu Tan, Jian Chen, Lei Li, Bin Yan
Format: Article
Language:English
Published: MDPI AG 2021-12-01
Series:Sensors
Subjects:
nanoscale computed tomography (nano-CT)
thermal drift correction
outlier elimination
Online Access:https://www.mdpi.com/1424-8220/21/24/8493

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https://www.mdpi.com/1424-8220/21/24/8493

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