Unraveling the origin of ferroelectric resistance switching through the interfacial engineering of layered ferroelectric-metal junctions

The mechanism of ferroelectric resistance switching is still under debate. Here, the authors propose an interfacial engineering approach to demonstrate its origin and find that it is governed by three independent variables: polarization, barrier change, and initial barrier.

Bibliographic Details
Main Authors: Fei Xue, Xin He, Yinchang Ma, Dongxing Zheng, Chenhui Zhang, Lain-Jong Li, Jr-Hau He, Bin Yu, Xixiang Zhang
Format: Article
Language:English
Published: Nature Portfolio 2021-12-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-021-27617-6