Structural, dielectric and ferroelectric characterization of PZT thin films

Structural, dielectric and ferroelectric characterization of PZT thin films

In this work ferroelectric thin films of PZT were prepared by the oxide precursor method, deposited on Pt/Si substrate. Films of 0.5 mm average thickness were obtained. Electrical and ferroelectric characterization were carried out in these films. The measured value of the dielectric constant for fi...

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Bibliographic Details
Main Authors: Araújo E.B., Eiras J.A.
Format: Article
Language:English
Published: Associação Brasileira de Cerâmica 1999-01-01
Series:Cerâmica
Subjects:
Thin films
PZT
ferroelectrics
Online Access:http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69131999000200010

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