Low-Cost AR-Based Dimensional Metrology for Assembly

The goal of this study was to create and demonstrate a system to perform fast and inexpensive quality dimensional inspection for industrial assembly line applications with submillimeter uncertainty. Our focus is on the positional errors of the assembled pieces on a larger part as it is assembled. Th...

Full description

Bibliographic Details
Main Authors: Rahma Nawab, Angela Davies Allen
Format: Article
Language:English
Published: MDPI AG 2022-03-01
Series:Machines
Subjects:
Online Access:https://www.mdpi.com/2075-1702/10/4/243