Low-Cost AR-Based Dimensional Metrology for Assembly
The goal of this study was to create and demonstrate a system to perform fast and inexpensive quality dimensional inspection for industrial assembly line applications with submillimeter uncertainty. Our focus is on the positional errors of the assembled pieces on a larger part as it is assembled. Th...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2022-03-01
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| Series: | Machines |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2075-1702/10/4/243 |
| _version_ | 1797410343603929088 |
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| author | Rahma Nawab Angela Davies Allen |
| author_facet | Rahma Nawab Angela Davies Allen |
| author_sort | Rahma Nawab |
| collection | DOAJ |
| description | The goal of this study was to create and demonstrate a system to perform fast and inexpensive quality dimensional inspection for industrial assembly line applications with submillimeter uncertainty. Our focus is on the positional errors of the assembled pieces on a larger part as it is assembled. This is achieved by using an open-source photogrammetry architecture to gather a point cloud data of an assembled part and then comparing this to a computer-aided design (CAD) model. The point cloud comparison to the CAD model is used to quantify errors in position using the iterative closest point (ICP) algorithm. Augmented reality is utilized to view the errors in a live-video feed and effectively display said errors. The initial demonstration showed an assembled position error of 9 mm ± 0.4 mm for a 40-mm high post. |
| first_indexed | 2024-03-09T04:28:33Z |
| format | Article |
| id | doaj.art-38a1e6a1981c4253bc289d4700f1ac02 |
| institution | Directory Open Access Journal |
| issn | 2075-1702 |
| language | English |
| last_indexed | 2024-03-09T04:28:33Z |
| publishDate | 2022-03-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Machines |
| spelling | doaj.art-38a1e6a1981c4253bc289d4700f1ac022023-12-03T13:38:30ZengMDPI AGMachines2075-17022022-03-0110424310.3390/machines10040243Low-Cost AR-Based Dimensional Metrology for AssemblyRahma Nawab0Angela Davies Allen1Center for Precision Metrology, University of North Carolina at Charlotte, Charlotte, NC 28262, USACenter for Precision Metrology, University of North Carolina at Charlotte, Charlotte, NC 28262, USAThe goal of this study was to create and demonstrate a system to perform fast and inexpensive quality dimensional inspection for industrial assembly line applications with submillimeter uncertainty. Our focus is on the positional errors of the assembled pieces on a larger part as it is assembled. This is achieved by using an open-source photogrammetry architecture to gather a point cloud data of an assembled part and then comparing this to a computer-aided design (CAD) model. The point cloud comparison to the CAD model is used to quantify errors in position using the iterative closest point (ICP) algorithm. Augmented reality is utilized to view the errors in a live-video feed and effectively display said errors. The initial demonstration showed an assembled position error of 9 mm ± 0.4 mm for a 40-mm high post.https://www.mdpi.com/2075-1702/10/4/243quality inspectionphotogrammetryiterative closest pointpoint cloudaugmented reality |
| spellingShingle | Rahma Nawab Angela Davies Allen Low-Cost AR-Based Dimensional Metrology for Assembly Machines quality inspection photogrammetry iterative closest point point cloud augmented reality |
| title | Low-Cost AR-Based Dimensional Metrology for Assembly |
| title_full | Low-Cost AR-Based Dimensional Metrology for Assembly |
| title_fullStr | Low-Cost AR-Based Dimensional Metrology for Assembly |
| title_full_unstemmed | Low-Cost AR-Based Dimensional Metrology for Assembly |
| title_short | Low-Cost AR-Based Dimensional Metrology for Assembly |
| title_sort | low cost ar based dimensional metrology for assembly |
| topic | quality inspection photogrammetry iterative closest point point cloud augmented reality |
| url | https://www.mdpi.com/2075-1702/10/4/243 |
| work_keys_str_mv | AT rahmanawab lowcostarbaseddimensionalmetrologyforassembly AT angeladaviesallen lowcostarbaseddimensionalmetrologyforassembly |