Edge roughness analysis in nanoscale for single-molecule localization microscopy images

Edge roughness analysis in nanoscale for single-molecule localization microscopy images

The recent advances in super-resolution fluorescence microscopy, including single-molecule localization microscopy (SMLM), has enabled the study of previously inaccessible details, such as the organization of proteins within cellular compartments and even nanostructures in nonbiological nanomaterial...

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Bibliographic Details
Main Authors: Jeong Uidon, Go Ga-eun, Jeong Dokyung, Lee Dongmin, Kim Min Jeong, Kang Minjae, Kim Namyoon, Jung Jaehwang, Kim Wookrae, Lee Myungjun, Kim Doory
Format: Article
Language:English
Published: De Gruyter 2024-01-01
Series:Nanophotonics
Subjects:
single-molecule localization microscopy
semiconductor
cell membrane roughness
edge roughness analysis
line edge roughness
power spectral density
Online Access:https://doi.org/10.1515/nanoph-2023-0709

Internet

https://doi.org/10.1515/nanoph-2023-0709

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