Edge roughness analysis in nanoscale for single-molecule localization microscopy images
The recent advances in super-resolution fluorescence microscopy, including single-molecule localization microscopy (SMLM), has enabled the study of previously inaccessible details, such as the organization of proteins within cellular compartments and even nanostructures in nonbiological nanomaterial...
| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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De Gruyter
2024-01-01
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| Series: | Nanophotonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/nanoph-2023-0709 |
| _version_ | 1826963891772456960 |
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| author | Jeong Uidon Go Ga-eun Jeong Dokyung Lee Dongmin Kim Min Jeong Kang Minjae Kim Namyoon Jung Jaehwang Kim Wookrae Lee Myungjun Kim Doory |
| author_facet | Jeong Uidon Go Ga-eun Jeong Dokyung Lee Dongmin Kim Min Jeong Kang Minjae Kim Namyoon Jung Jaehwang Kim Wookrae Lee Myungjun Kim Doory |
| author_sort | Jeong Uidon |
| collection | DOAJ |
| description | The recent advances in super-resolution fluorescence microscopy, including single-molecule localization microscopy (SMLM), has enabled the study of previously inaccessible details, such as the organization of proteins within cellular compartments and even nanostructures in nonbiological nanomaterials, such as the polymers and semiconductors. With such developments, the need for the development of various computational nanostructure analysis methods for SMLM images is also increasing; however, this has been limited to protein cluster analysis. In this study, we developed an edge structure analysis method for pointillistic SMLM images based on the line edge roughness and power spectral density analyses. By investigating the effect of point properties in SMLM images, such as the size, density, and localization precision on the roughness measurement, we successfully demonstrated this analysis method for experimental SMLM images of actual samples, including the semiconductor line patterns, cytoskeletal elements, and cell membranes. This systematic investigation of the effect of each localization rendering parameter on edge roughness measurement provides a range for the optimal rendering parameters that preserve the relevant nanoscale structure of interest. These new methods are expected to expand our understanding of the targets by providing valuable insights into edge nanoscale structures that have not been previously obtained quantitatively. |
| first_indexed | 2024-03-08T05:28:45Z |
| format | Article |
| id | doaj.art-38b4012063e04d97a95dc9de81e18359 |
| institution | Directory Open Access Journal |
| issn | 2192-8606 2192-8614 |
| language | English |
| last_indexed | 2025-02-18T02:48:19Z |
| publishDate | 2024-01-01 |
| publisher | De Gruyter |
| record_format | Article |
| series | Nanophotonics |
| spelling | doaj.art-38b4012063e04d97a95dc9de81e183592024-11-25T11:19:11ZengDe GruyterNanophotonics2192-86062192-86142024-01-0113219520710.1515/nanoph-2023-0709Edge roughness analysis in nanoscale for single-molecule localization microscopy imagesJeong Uidon0Go Ga-eun1Jeong Dokyung2Lee Dongmin3Kim Min Jeong4Kang Minjae5Kim Namyoon6Jung Jaehwang7Kim Wookrae8Lee Myungjun9Kim Doory10Department of Chemistry, Hanyang University, Seoul04763, Republic of KoreaDepartment of Chemistry, Hanyang University, Seoul04763, Republic of KoreaDepartment of Chemistry, Hanyang University, Seoul04763, Republic of KoreaDepartment of Chemistry, Hanyang University, Seoul04763, Republic of KoreaDepartment of Chemistry, Hanyang University, Seoul04763, Republic of KoreaDepartment of Chemistry, Hanyang University, Seoul04763, Republic of KoreaMI Equipment R&D Team, Mechatronics Research, Samsung Electronics Co., Ltd., Hwaseong18848, Republic of KoreaMI Equipment R&D Team, Mechatronics Research, Samsung Electronics Co., Ltd., Hwaseong18848, Republic of KoreaMI Equipment R&D Team, Mechatronics Research, Samsung Electronics Co., Ltd., Hwaseong18848, Republic of KoreaMI Equipment R&D Team, Mechatronics Research, Samsung Electronics Co., Ltd., Hwaseong18848, Republic of KoreaDepartment of Chemistry, Hanyang University, Seoul04763, Republic of KoreaThe recent advances in super-resolution fluorescence microscopy, including single-molecule localization microscopy (SMLM), has enabled the study of previously inaccessible details, such as the organization of proteins within cellular compartments and even nanostructures in nonbiological nanomaterials, such as the polymers and semiconductors. With such developments, the need for the development of various computational nanostructure analysis methods for SMLM images is also increasing; however, this has been limited to protein cluster analysis. In this study, we developed an edge structure analysis method for pointillistic SMLM images based on the line edge roughness and power spectral density analyses. By investigating the effect of point properties in SMLM images, such as the size, density, and localization precision on the roughness measurement, we successfully demonstrated this analysis method for experimental SMLM images of actual samples, including the semiconductor line patterns, cytoskeletal elements, and cell membranes. This systematic investigation of the effect of each localization rendering parameter on edge roughness measurement provides a range for the optimal rendering parameters that preserve the relevant nanoscale structure of interest. These new methods are expected to expand our understanding of the targets by providing valuable insights into edge nanoscale structures that have not been previously obtained quantitatively.https://doi.org/10.1515/nanoph-2023-0709single-molecule localization microscopysemiconductorcell membrane roughnessedge roughness analysisline edge roughnesspower spectral density |
| spellingShingle | Jeong Uidon Go Ga-eun Jeong Dokyung Lee Dongmin Kim Min Jeong Kang Minjae Kim Namyoon Jung Jaehwang Kim Wookrae Lee Myungjun Kim Doory Edge roughness analysis in nanoscale for single-molecule localization microscopy images Nanophotonics single-molecule localization microscopy semiconductor cell membrane roughness edge roughness analysis line edge roughness power spectral density |
| title | Edge roughness analysis in nanoscale for single-molecule localization microscopy images |
| title_full | Edge roughness analysis in nanoscale for single-molecule localization microscopy images |
| title_fullStr | Edge roughness analysis in nanoscale for single-molecule localization microscopy images |
| title_full_unstemmed | Edge roughness analysis in nanoscale for single-molecule localization microscopy images |
| title_short | Edge roughness analysis in nanoscale for single-molecule localization microscopy images |
| title_sort | edge roughness analysis in nanoscale for single molecule localization microscopy images |
| topic | single-molecule localization microscopy semiconductor cell membrane roughness edge roughness analysis line edge roughness power spectral density |
| url | https://doi.org/10.1515/nanoph-2023-0709 |
| work_keys_str_mv | AT jeonguidon edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT gogaeun edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT jeongdokyung edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT leedongmin edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT kimminjeong edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT kangminjae edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT kimnamyoon edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT jungjaehwang edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT kimwookrae edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT leemyungjun edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages AT kimdoory edgeroughnessanalysisinnanoscaleforsinglemoleculelocalizationmicroscopyimages |