Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust

Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust

Abstract Background Fusarium head blight (FHB) caused by the fungus Fusarium graminearum Schwabe and stripe rust caused by Puccinia striiformis f. sp. tritici are devastating diseases that affect wheat production worldwide. The use of disease-resistant genes and cultivars is the most effective means...

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Bibliographic Details
Main Authors: Biran Gong, Wei Zhu, Sanyue Li, Yuqi Wang, Lili Xu, Yi Wang, Jian Zeng, Xing Fan, Lina Sha, Haiqin Zhang, Pengfei Qi, Lin Huang, Guoyue Chen, Yonghong Zhou, Houyang Kang
Format: Article
Language:English
Published: BMC 2019-12-01
Series:BMC Plant Biology
Subjects:
Chromosomal translocation line
Elymus repens
Fusarium head blight (FHB)
Stripe rust
Online Access:https://doi.org/10.1186/s12870-019-2208-x

Internet

https://doi.org/10.1186/s12870-019-2208-x

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