Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory States

In this study, the read operation of feedback field-effect transistors (FBFETs) with quasi-nonvolatile memory states was analyzed using a device simulator. For FBFETs, write pulses of 40 ns formed potential barriers in their channels, and charge carriers were accumulated (depleted) in these channels...

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Bibliographic Details
Main Authors: Juhee Jeon, Kyoungah Cho, Sangsig Kim
Format: Article
Language:English
Published: MDPI AG 2024-01-01
Series:Nanomaterials
Subjects:
Online Access:https://www.mdpi.com/2079-4991/14/2/210