Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory States

In this study, the read operation of feedback field-effect transistors (FBFETs) with quasi-nonvolatile memory states was analyzed using a device simulator. For FBFETs, write pulses of 40 ns formed potential barriers in their channels, and charge carriers were accumulated (depleted) in these channels...

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Main Authors: Juhee Jeon, Kyoungah Cho, Sangsig Kim
Format: Article
Language:English
Published: MDPI AG 2024-01-01
Series:Nanomaterials
Subjects:
Online Access:https://www.mdpi.com/2079-4991/14/2/210
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author Juhee Jeon
Kyoungah Cho
Sangsig Kim
author_facet Juhee Jeon
Kyoungah Cho
Sangsig Kim
author_sort Juhee Jeon
collection DOAJ
description In this study, the read operation of feedback field-effect transistors (FBFETs) with quasi-nonvolatile memory states was analyzed using a device simulator. For FBFETs, write pulses of 40 ns formed potential barriers in their channels, and charge carriers were accumulated (depleted) in these channels, generating the memory state “State 1 (State 0)”. Read pulses of 40 ns read these states with a retention time of 3 s, and the potential barrier formation and carrier accumulation were influenced by these read pulses. The potential barriers were analyzed, using junction voltage and current density to explore the memory states. Moreover, FBFETs exhibited nondestructive readout characteristics during the read operation, which depended on the read voltage and pulse width.
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spelling doaj.art-394c5a4dfc994ee785ef4196679a78df2024-01-26T17:58:41ZengMDPI AGNanomaterials2079-49912024-01-0114221010.3390/nano14020210Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory StatesJuhee Jeon0Kyoungah Cho1Sangsig Kim2Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 02841, Republic of KoreaDepartment of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 02841, Republic of KoreaDepartment of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 02841, Republic of KoreaIn this study, the read operation of feedback field-effect transistors (FBFETs) with quasi-nonvolatile memory states was analyzed using a device simulator. For FBFETs, write pulses of 40 ns formed potential barriers in their channels, and charge carriers were accumulated (depleted) in these channels, generating the memory state “State 1 (State 0)”. Read pulses of 40 ns read these states with a retention time of 3 s, and the potential barrier formation and carrier accumulation were influenced by these read pulses. The potential barriers were analyzed, using junction voltage and current density to explore the memory states. Moreover, FBFETs exhibited nondestructive readout characteristics during the read operation, which depended on the read voltage and pulse width.https://www.mdpi.com/2079-4991/14/2/210quasi-nonvolatile memoryTCADFBFETread operationrising time
spellingShingle Juhee Jeon
Kyoungah Cho
Sangsig Kim
Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory States
Nanomaterials
quasi-nonvolatile memory
TCAD
FBFET
read operation
rising time
title Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory States
title_full Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory States
title_fullStr Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory States
title_full_unstemmed Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory States
title_short Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory States
title_sort read operation mechanism of feedback field effect transistors with quasi nonvolatile memory states
topic quasi-nonvolatile memory
TCAD
FBFET
read operation
rising time
url https://www.mdpi.com/2079-4991/14/2/210
work_keys_str_mv AT juheejeon readoperationmechanismoffeedbackfieldeffecttransistorswithquasinonvolatilememorystates
AT kyoungahcho readoperationmechanismoffeedbackfieldeffecttransistorswithquasinonvolatilememorystates
AT sangsigkim readoperationmechanismoffeedbackfieldeffecttransistorswithquasinonvolatilememorystates