Bond strength evaluation of heat treated Cu-Al wire bonding

Bond strength evaluation of wire bonding in microchips is the key study in any wire bonding mechanism. The quality of the wire bond interconnection relates very closely to the reliability of the microchip during performance of its function in any application. In many reports, concerns regarding the...

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Bibliographic Details
Main Authors: S. Shariza, T. Joseph Sahaya Anand, A. R. M. Warikh, Lee Cher Chia, Chua Kok Yau, Lim Boon Huat
Format: Article
Language:English
Published: Universiti Malaysia Pahang Publishing 2018-12-01
Series:Journal of Mechanical Engineering and Sciences
Subjects:
Online Access:https://journal.ump.edu.my/jmes/article/view/382