Bond strength evaluation of heat treated Cu-Al wire bonding
Bond strength evaluation of wire bonding in microchips is the key study in any wire bonding mechanism. The quality of the wire bond interconnection relates very closely to the reliability of the microchip during performance of its function in any application. In many reports, concerns regarding the...
Main Authors: | S. Shariza, T. Joseph Sahaya Anand, A. R. M. Warikh, Lee Cher Chia, Chua Kok Yau, Lim Boon Huat |
---|---|
Format: | Article |
Language: | English |
Published: |
Universiti Malaysia Pahang Publishing
2018-12-01
|
Series: | Journal of Mechanical Engineering and Sciences |
Subjects: | |
Online Access: | https://journal.ump.edu.my/jmes/article/view/382 |
Similar Items
-
Failure Analysis for Gold Wire Bonding of Sensor Packaging Based on Experimental and Numerical Methods
by: Yameng Sun, et al.
Published: (2023-08-01) -
Characterization of Wire-Bonding on LDS Materials and HF-PCBs for High-Frequency Applications
by: Thomas Guenther, et al.
Published: (2022-01-01) -
Copper Wire Bonding: A Review
by: Hongliang Zhou, et al.
Published: (2023-08-01) -
Corrosion Study and Intermetallics Formation in Gold and Copper Wire Bonding in Microelectronics Packaging
by: Christopher Breach, et al.
Published: (2013-07-01) -
Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging
by: Yuemin Zhang, et al.
Published: (2023-07-01)