Operando double-edge high-resolution X-ray absorption spectroscopy study of BiVO4 photoanodes

Operando double-edge high-resolution X-ray absorption spectroscopy study of BiVO4 photoanodes

High energy resolution fluorescence detected X-ray absorption spectroscopy is a powerful method for probing the electronic structure of functional materials. The X-ray penetration depth and photon-in/photon-out nature of the method allow operando experiments to be performed, in particular in electro...

Cur síos iomlán

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí: Alberto Piccioni, Jagadesh Kopula Kesavan, Lucia Amidani, Raffaello Mazzaro, Serena Berardi, Stefano Caramori, Luca Pasquini, Federico Boscherini
Formáid: Alt
Teanga:English
Foilsithe / Cruthaithe: International Union of Crystallography 2024-05-01
Sraith:Journal of Synchrotron Radiation
Ábhair:
x-ray absorption spectroscopy
photoelectrochemistry
photoanodes
resonant inelastic x-ray scattering
Rochtain ar líne:http://scripts.iucr.org/cgi-bin/paper?S1600577524002741

Ar líne

http://scripts.iucr.org/cgi-bin/paper?S1600577524002741

Míreanna comhchosúla