Erratum: “The role of defects in the electrical properties of NbO2 thin film vertical devices” [AIP Advances 6, 125006 (2016)]
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-01-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4974747 |