Crop Leaf Phenotypic Parameter Measurement Based on the RKM-D Point Cloud Method
Crop leaf length, perimeter, and area serve as vital phenotypic indicators of crop growth status, the measurement of which is important for crop monitoring and yield estimation. However, processing a leaf point cloud is often challenging due to cluttered, fluctuating, and uncertain points, which cul...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-03-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/24/6/1998 |