A Simple Method to Validate Power Loss in Medium Voltage SiC MOSFETs and Schottky Diodes Operating in a Three-Phase Inverter
This paper presents an original method of power loss validation in medium-voltage SiC MOSFET (metal–oxide–semiconductor field-effect transistor) modules of a three-phase inverter. The base of this method is a correct description of the on-state performance of the diodes and the transistors in a PWM...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-09-01
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Series: | Energies |
Subjects: | |
Online Access: | https://www.mdpi.com/1996-1073/13/18/4773 |