A Simple Method to Validate Power Loss in Medium Voltage SiC MOSFETs and Schottky Diodes Operating in a Three-Phase Inverter

This paper presents an original method of power loss validation in medium-voltage SiC MOSFET (metal–oxide–semiconductor field-effect transistor) modules of a three-phase inverter. The base of this method is a correct description of the on-state performance of the diodes and the transistors in a PWM...

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Bibliographic Details
Main Authors: Jacek Rąbkowski, Hubert Skoneczny, Rafał Kopacz, Przemysław Trochimiuk, Grzegorz Wrona
Format: Article
Language:English
Published: MDPI AG 2020-09-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/13/18/4773