Dislocation Loop Generation Differences between Thin Films and Bulk in EFDA Pure Iron under Self-Ion Irradiation at 20 MeV

Dislocation Loop Generation Differences between Thin Films and Bulk in EFDA Pure Iron under Self-Ion Irradiation at 20 MeV

In the present investigation, high-energy self-ion irradiation experiments (20 MeV Fe<sup>+4</sup>) were performed on two types of pure Fe samples to evaluate the formation of dislocation loops as a function of material volume. The choice of model material, namely EFDA pure Fe, was made...

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Bibliographic Details
Main Authors: Marcelo Roldán, Fernando José Sánchez, Pilar Fernández, Christophe J. Ortiz, Adrián Gómez-Herrero, David Jiménez Rey
Format: Article
Language:English
Published: MDPI AG 2021-12-01
Series:Metals
Subjects:
irradiation damage characterisation
thin films
dislocation loops
transmission electron microscopy
Online Access:https://www.mdpi.com/2075-4701/11/12/2000

Internet

https://www.mdpi.com/2075-4701/11/12/2000

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