Effect of the anisotropic characteristics of β-Sn on current-induced solder evolution

The miniaturization trend of three-dimensional integrated circuits poses great challenges to solder reliability under high current stressing since anisotropic issues tend to be enhanced in microscale solder bumps. To address these challenges, the solder evolution at the microscale and the correspond...

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Bibliographic Details
Main Authors: Huijun Cao, Yu Zhang, Yinggan Zhang, Jiajia Han, Dongchuan Su, Zhihao Zhang
Format: Article
Language:English
Published: Elsevier 2022-12-01
Series:Materials & Design
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S0264127522009613