OBSERVATIONS ON THE PERFORMANCE OF X-RAY COMPUTED TOMOGRAPHY FOR DIMENSIONAL METROLOGY
X-ray computed tomography (XCT) is a rising technology within many industries and sectors with a demand for dimensional metrology, defect, void analysis and reverse engineering. There are many variables that can affect the dimensional metrology of objects imaged using XCT, this paper focusses on the...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Copernicus Publications
2016-06-01
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| Series: | The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences |
| Online Access: | https://www.int-arch-photogramm-remote-sens-spatial-inf-sci.net/XLI-B5/25/2016/isprs-archives-XLI-B5-25-2016.pdf |