Polarized Raman scattering study of PSN single crystals and epitaxial thin films

Polarized Raman scattering study of PSN single crystals and epitaxial thin films

This paper describes a detailed analysis of the dependence of Raman scattering intensity on the polarization of the incident and inelastically scattered light in PbSc0.5Nb0.5O3 (PSN) single crystals and epitaxially compressed thin films grown on (100)-oriented MgO substrates. It is found that there...

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Bibliographic Details
Main Authors: J. Pokorný, I. Rafalovskyi, I. Gregora, F. Borodavka, M. Savinov, J. Drahokoupil, M. Tyunina, T. Kocourek, M. Jelinek, Y. Bing, Z.-G. Ye, J. Hlinka
Format: Article
Language:English
Published: World Scientific Publishing 2015-06-01
Series:Journal of Advanced Dielectrics
Subjects:
PbSc0.5Nb0.5O3 (PSN)
relaxors
ferroelectrics
complex perovskites
Raman scattering
Online Access:http://www.worldscientific.com/doi/pdf/10.1142/S2010135X15500137

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http://www.worldscientific.com/doi/pdf/10.1142/S2010135X15500137

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